| Type |  Book |
| ชื่อเรื่อง | IEEE standard for information technology : test methods for measuring conformance to POSIX. Part 1 :system interfaces / sponsor Technical Committee on Operating Systems and Application Environments of the IEEE Computer Society |
| ISBN | 1-55937-275-3 |
| | 1559372753 (pbk) |
| พิมพลักษณ์ | New York : Institute of Electrical and Electronics Engineers, c1993 |
| | New York, N.Y. : Institute of Electricaland Electronics Engineers, 1993 |
| รูปเล่ม | 442 p. ; 29 cm |
| หัวเรื่อง | Application software --Testing --Standards --United States [] |
| | C (Computer program language) |
| | Operating systems (Computers) --Standards --United States [] |
| | Information technology standards |
| | Operating systems (Computers) standards |