Type | Book |
ชื่อเรื่อง | Next generation technology-enhanced assessment : global perspectives on occupational and workplace testing / edited by John C. Scott, David Bartram, Doug H. Reynolds |
ISBN | 9781107124363 |
รูปเล่ม | xx, 401 pages : illustrations ; 24 cm |
หัวเรื่อง | Ability --Testing --Technological innovations [] |
| Internet questionnaires |
| Interviewing --Data processing [] |
| Interviewing --Data processing [] |
| Psychological tests --Data processing [] |