| Type |  Book |
| ชื่อเรื่อง | Ellipsometry at the Nanoscale [electronic resource] / edited by Maria Losurdo, Kurt Hingerl |
| ISBN | 9783642339554 |
| | 9783642339561 |
| พิมพลักษณ์ | Berlin, Heidelberg : Springer Berlin Heidelberg, c2013 |
| รูปเล่ม | 1 online resource |
| หัวเรื่อง | Measurement science and instrumentation |
| | Characterization and evaluation of materials |
| | Electronic books |
| | Engineering |
| | Engineering |
| | Nanotechnology and microengineering |
| | Nanotechnology |
| | Nanotechnology |
| | Surfaces (Physics) |